IOLTS 2014 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products.There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wear-out and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Council on Electronic Design Automation (CEDA) and the 2014 edition is organized by the IEEE Computer Society Test Technology Technical Council, the University of Athens, and the TIMA Laboratory.

The topics of interest include (but are not limited to) the following ones:

Reliability issues in nanometer technologies	On-line testing of analog and mixed signal circuits
Radiation effects	On-line testing in industry, automotive, railway, avionics, space
Design for reliability	On-line testing in the continuous operation of large systems
Design for variability	Field diagnosis, maintainability and reconfiguration
On-line power monitoring and control	Fault-tolerant and fail-safe systems
On-line current, temperature, etc, monitoring	Dependability evaluation
Secure circuit design	Dependable systems design
Fault-based attacks and counter measures	On-line and off-line built-in self-test
Self-checking circuits and coding theory	Synthesis of on-line testable circuits

Submissions

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The IOLTS Committee invites authors to submit papers in the above or related technical areas. Accepted papers and posters will be included in formal Proceedings to be published by the IEEE. Papers must be submitted electronically following the instructions provided at the symposium web site. Papers should be in the standard IEEE conferences double-column format. If accepted, regular papers should be allowed six pages in the IEEE Proceedings of the Symposium.

Key Dates

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Submission deadline: March 14, 2014
Notification of acceptance:April 30, 2014
Final copy deadline: May 26, 2014

Additional Information

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Submission Information		General Information
Dimitris Gizopoulos	Dan Alexandrescu	Michael Nicolaidis
University of Athens Athens, Greece Tel: +30 210 7275145 dgizop@di.uoa.gr	iRoC Technologies Grenoble, France Tel: +33 (0) 4 38 12 07 63 dan.alexandrescu@iroctech.com	TIMA Laboratory Grenoble, France Tel: +33 (0) 4 76 57 46 96 michael.nicolaidis@imag.fr

Committees

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TBA

For more information, visit us on the web at: http://tima.imag.fr/conferences/iolts

The IEEE International On-Line Testing Symposium (IOLTS 2014) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).